Bibliografía: al final de cada artículo Notas: al pie de texto SPECIAL ISSUE Guest Editors' Intorduction Adressin the chanlleges of debuts ad diagnosis/ Rob Aiken and Erik Marinissen p206 Funtional debug techniques for embedded systems / Bart Vermeulen. p.216 In - sistem Silicon validation and debug / Miron Vermeulen. p.216 Case study on speed failure causes in a microprocessor / Kip Kilpack; Suriyaprakash Natarajan; Pouria Bastani and Arun Krishnamachary. p.224 Linling statistical learning to diagnosisi / Pouria Batani; Li - C Wang and Magdy S Abadir. p.232 Survey of scan chain diagnosis / Yu Huang; Ruifeng Gou; Wu - Tung Cheng and James Chien - Mo Li. p.240 Physical techniques for chip- backside IC debug in nanotechnologies / Christian Boit; Rudolf Schlangen; Uwe Kerts and Ted Lundquist. p.258 ROUNDTABLE Thousand - core chips / David Yeh; Li - Shiuan; Shekhan Borkar; John Darrienger; Anant Agarwal and Wen - Mei Hwu. p.272
